Determination of rough microstructures on the surface of metals using the light scattering method in waveguides

Abstract

In this paper, we present the main results for the theoretical, numerical and experimental analysis of a new method to measure the roughness of metal surfaces. The requirements for a waveguide optical resonator, which is the main optical node of the device implementing this method, have been developed. A comparative analysis of two different designs of an optical node is performed. The energy spectra of the roughness of various surfaces were measured. As a result of the research, the main advantages of the method under consideration and practical recommendations are provided to improve the design of the device that implements this method.