Flat Specimen Shape Recognition Based on Full-Field Optical Measurements and Registration Using Mapping Error Minimization Method

Abstract

In the paper, an alignment methodology of finite element and full-field measurement data of planar specimens is presented. The alignment procedure represents an essential part of modern material response characterisation using heterogeneous strain-field specimens. The methodology addresses both the specimen recognition from a measurement’s image and the alignment procedure and is designed to be applied on a single measurement system. This is essential for its practical application because both processes, shape recognition and alignment, must be performed only after the specimen is fully prepared for the digital image correlation (DIC) measurements (white background and black speckles) and placed into a testing machine. The specimen can be observed with a single camera or with a multicamera system. The robustness of the alignment method is presented on a treatment of a specimen with a metamaterial-like structure and compared with the well-known iterative closest point (ICP) algorithm. The performance of the methodology is also demonstrated on a real DIC application.