Conductivity and photoelectric response of electrodeposited thallic oxide films

Junfu Liu , Zuhong Lu , Shiyong Zhao , Kongzhang Yang
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引用次数: 2

Abstract

Highly conductive polycrystalline and amorphous Tl2O3 films are prepared by electrodeposition method. The resistivity of the polycrystalline film is lower than that of the amorphous one. A resisitivity of only 3.2×10-4 Ω cm was obtained for the polycrystalline film. It is found that the electrodeposited Tl2O3 films exhibit photoelectric response of n-type semiconductors. This photoelectric response may find use for further application of the Tl2O3 films.

电沉积氧化二甲苯薄膜的电导率和光电响应
采用电沉积法制备了高导电性的多晶和非晶Tl2O3薄膜。多晶薄膜的电阻率低于非晶薄膜。该多晶薄膜的电阻率仅为3.2×10-4 Ω cm。发现电沉积的Tl2O3薄膜表现出n型半导体的光电响应。这种光电响应可以用于Tl2O3薄膜的进一步应用。
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