Study of V-groove on Leadframe/Epoxy Mold Compound Delamination Improvement

H. Fan, Hugo Wong, F. Wong, Kai Zhang, Haibin Chen
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Abstract

The design of packages with high performance while maintaining the highest possible reliability is a challenge. To design reliable packages, understanding all possible failure modes as possible is becoming a key. Delamination is still a potential concern on product reliability, especially delamination at leadframe and epoxy mould compound (EMC) interface. A good understanding of factor effect on delamination factors will help to drive improvements on design and process optimization to minimize delamination concern. In this study, simulations are conducted to investigate effects of V-groove angle, depth and location on delamination propagation at the leadframe (LF)/EMC interface, indicating that smaller V-groove angle together with deeper V-groove and V- groove located far away from body edge can help reduce risk of delamination propagation. However it can also trigger other concerns, like crack near V-groove tip and difficulty in leadframe manufacturing. Therefore, V-groove design has to be optimized to achieve delamination requirement, and also fulfill process specification in the assembly line and capability of leadframe suppliers. This study demonstrates simulation driven development on delamination improvement.
v型槽对引线框架/环氧模复合材料分层改善的研究
在保持最高可靠性的同时设计高性能的封装是一项挑战。为了设计可靠的封装,尽可能了解所有可能的故障模式正成为关键。脱层仍然是影响产品可靠性的一个潜在问题,特别是引线框和环氧模复合材料(EMC)界面的脱层。对分层因素影响的良好理解将有助于推动设计和工艺优化的改进,以最大限度地减少分层问题。本文通过仿真研究了V型槽角、深度和位置对引线框架/电磁兼容界面上分层传播的影响,结果表明,较小的V型槽角、较深的V型槽以及远离机身边缘的V型槽可以降低分层传播的风险。然而,它也可能引发其他问题,如v型槽尖端附近的裂纹和引线框架制造的困难。因此,必须对v型槽设计进行优化,以达到分层要求,并满足装配线的工艺规范和引线框架供应商的能力。本研究演示了模拟驱动的分层改进开发。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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