High-Density Growth of Single-Walled Carbon Nanotubes Using Cobalt on Cobalt Silicide Formed via Simplified Process as a Catalyst by Hot-Filament CVD at Low-Temperatures

Hyomen Kagaku Pub Date : 2017-01-01 DOI:10.1380/jsssj.38.357
Y. Ishikawa, S. Kim
{"title":"High-Density Growth of Single-Walled Carbon Nanotubes Using Cobalt on Cobalt Silicide Formed via Simplified Process as a Catalyst by Hot-Filament CVD at Low-Temperatures","authors":"Y. Ishikawa, S. Kim","doi":"10.1380/jsssj.38.357","DOIUrl":null,"url":null,"abstract":"As a support of catalytic Co nanoparticles used for the growth of high-density single-walled carbon nanotubes (SWCNTs), conductive Co silicide films are superior to insulating SiO2 films. A Co silicide films is formed through reaction between a Co thin film and the underlying Si wafer. During this process, however, a TiN cap film must be formed to prevent the Co thin film from forming Co nanoparticles and must be etched after the formation of the silicide film, which makes the formation process complicated. In this study, we optimized the thickness of the Co film and formed a silicide film without using a TiN cap film to simplify the formation process. As a result, the formation of the Co nanoparticles was greatly suppressed during the formation of a silicide film. Using the Co silicide film obtained after the formation process at 650°C for 10 min as the support of catalytic Co nanoparticles, vertically aligned CNTs film with a thickness of 5.3 μm were obtained by hot-filament chemical vapor deposition (CVD) with ethanol steam at 450°C for 30 min. This thickness is approximately 1.8-fold that previously reported.","PeriodicalId":13075,"journal":{"name":"Hyomen Kagaku","volume":"3 1","pages":"357-361"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Hyomen Kagaku","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1380/jsssj.38.357","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

As a support of catalytic Co nanoparticles used for the growth of high-density single-walled carbon nanotubes (SWCNTs), conductive Co silicide films are superior to insulating SiO2 films. A Co silicide films is formed through reaction between a Co thin film and the underlying Si wafer. During this process, however, a TiN cap film must be formed to prevent the Co thin film from forming Co nanoparticles and must be etched after the formation of the silicide film, which makes the formation process complicated. In this study, we optimized the thickness of the Co film and formed a silicide film without using a TiN cap film to simplify the formation process. As a result, the formation of the Co nanoparticles was greatly suppressed during the formation of a silicide film. Using the Co silicide film obtained after the formation process at 650°C for 10 min as the support of catalytic Co nanoparticles, vertically aligned CNTs film with a thickness of 5.3 μm were obtained by hot-filament chemical vapor deposition (CVD) with ethanol steam at 450°C for 30 min. This thickness is approximately 1.8-fold that previously reported.
低温热丝气相沉积法制备硅化钴,以钴为催化剂,高密度生长单壁碳纳米管
作为催化Co纳米颗粒生长高密度单壁碳纳米管(SWCNTs)的载体,导电Co硅化膜优于绝缘SiO2膜。通过Co薄膜与衬底硅片之间的反应,形成了Co硅化物薄膜。但在此过程中,必须形成TiN帽膜以防止Co薄膜形成Co纳米颗粒,并且必须在硅化物膜形成后进行蚀刻,这使得形成过程变得复杂。在本研究中,我们优化了Co膜的厚度,在不使用TiN帽膜的情况下形成了硅化物膜,从而简化了形成过程。结果表明,在硅化物膜的形成过程中,Co纳米颗粒的形成受到了极大的抑制。利用650℃、10 min形成的硅化Co膜作为催化Co纳米颗粒的载体,采用450℃、30 min的乙醇蒸汽热丝化学气相沉积(CVD)法制备了厚度为5.3 μm的垂直定向碳纳米管膜,厚度约为先前报道的1.8倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信