Robustness of the floating-gate technique in a very low-noise environment

Abstract

In this paper we present the development of a cheap test bench to make the acquisition of very low leakage currents in Non-volatile memories. This test bench is embedded in a very particular low-noise environment to reduce ambient vibrations and electromagnetic perturbations. We will principally discuss the robustness of the full experiment concerning the acquisition conditions (integration time and number of measurements, choice of applied biases). Finally we will present the extraction steps and the resulting leakage current, below every direct measurement.