Computational Performance of GTD-RT Applied for Evaluation of Electromagnetic Scattering on Rough Surfaces

IF 0.6 4区 计算机科学 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
A. E. Farahat, K. Hussein, S. Guan, B. Du, D. Li, Y. Wang, Y. Zhu, Q. Wu, Y. Ji, A. Basmaci, J. Liu, Hongzheng Chen, Hong Zhang, J. Yuan, Z. Li, Q. Yu, S. Liu, Z. Huang, X. Kong, Y. Hu, Y. Wen, Somchat Sonasang, N. Angkawisittpan, Z. Yu, B. Li, S. Ding, W. Tang, S. Kim, J. Park, W. Lee, D. Wang, J. Yang, W. Wang, L. Yuan, X. Li, K. Mao, A. Wang, J. Tian, W. Zhou, H. Wu, S. Ji, J. Zhao, Z. Luo, H. Dai, T. A. Khan, M. I. Khattak, A. Tariq, N. Rajeshkumar, P. Sathya, S. Rahim, A. Eteng, Y. Zhang, X. Deng, E. Hajlaoui, Z. Almohaimeed, F. Fan, X. Fan, X. Wang, Z. Yan, R. Ma, Q. Feng, Y. Feng, P. Chen, S. Pan, G. Li, M. Khalifa, A. Yacoub, D. Aloi, M. Ucar, D. Elsheakh, O. Dardeer, E. Jin, Z. Song, X. Yang, X. Yu, Q. Ren, Jingyu Zhang, J. Luo, J. Park, P. Gurrala, B. Hornbuckle, J. Song
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引用次数: 0

Abstract

In this paper, a new robust computational method that applies the geometrical theory of diffraction (GTD) in conjunction with the ray tracing (RT) technique is developed to evaluate the electromagnetic scattering pattern due to a plane wave represented as beam of parallel rays incident on a rough surface of quite arbitrary statistical parameters. The development of the proposed technique is explained in detail taking into consideration the generation of the geometrical model of the rough surface. The Fresnel reflection model is applied under the assumption of arbitrary electrical and optical properties of the rough surface material. Also the polarization of the plane wave primarily incident on the rough surface is taken into consideration. The algorithm developed in the present work accounts for multiple bounces of an incident ray and, hence, it can be considered arbitrary higher-order GTD-RT technique. The accuracy of the obtained results is verified through the comparison with the experimental measurements of the scattering pattern of a light beam incident on rough sheets with specific statistical properties. The numerical results of the present work are concerned with investigating the dependence of the scattering pattern on the surface roughness, refractive index, angle of incidence, and the resolution of the geometric model of the rough surface. Also, it is shown that, for limited resolution of the rough surface model, the accuracy of the calculated scattered field depends on the angle of incidence of the primary beam and the surface roughness.
GTD-RT在粗糙表面电磁散射评估中的计算性能
本文应用几何衍射理论(GTD)和射线追迹技术(RT),建立了一种新的鲁棒计算方法来计算平面波入射到具有任意统计参数的粗糙表面时的电磁散射图。考虑到粗糙表面几何模型的生成,详细说明了该技术的发展。在粗糙表面材料的任意电学和光学性质的假设下,应用菲涅耳反射模型。同时考虑了主要入射到粗糙表面的平面波的偏振。在本工作中开发的算法解释了入射光线的多次反弹,因此,它可以被认为是任意高阶GTD-RT技术。通过与实验测量的光束在具有特定统计特性的粗糙片上的散射图进行比较,验证了所得结果的准确性。本工作的数值结果涉及研究散射模式对表面粗糙度、折射率、入射角和粗糙表面几何模型分辨率的依赖关系。在粗糙表面模型分辨率有限的情况下,散射场的计算精度取决于主光束入射角和表面粗糙度。
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来源期刊
CiteScore
1.60
自引率
28.60%
发文量
75
审稿时长
9 months
期刊介绍: The ACES Journal is devoted to the exchange of information in computational electromagnetics, to the advancement of the state of the art, and to the promotion of related technical activities. A primary objective of the information exchange is the elimination of the need to "re-invent the wheel" to solve a previously solved computational problem in electrical engineering, physics, or related fields of study. The ACES Journal welcomes original, previously unpublished papers, relating to applied computational electromagnetics. All papers are refereed. A unique feature of ACES Journal is the publication of unsuccessful efforts in applied computational electromagnetics. Publication of such material provides a means to discuss problem areas in electromagnetic modeling. Manuscripts representing an unsuccessful application or negative result in computational electromagnetics is considered for publication only if a reasonable expectation of success (and a reasonable effort) are reflected. The technical activities promoted by this publication include code validation, performance analysis, and input/output standardization; code or technique optimization and error minimization; innovations in solution technique or in data input/output; identification of new applications for electromagnetics modeling codes and techniques; integration of computational electromagnetics techniques with new computer architectures; and correlation of computational parameters with physical mechanisms.
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