Sheet Resistance Measurement of Inkjet Printed Layers

Abstract

The Van der Pauw method is a method commonly used to measure the resistance and Hall coefficient of a sample. Its advantage lies in its ability to accurately measure the properties of a random sample, ensuring that the sample is approximately two-dimensional (i.e., it is much thinner than it is wide), rigid (without holes), and the electrodes are located on the perimeter. The Van der Pauw method uses a 4-point probe around the sample circumference, unlike the linear 4-point probe: this allows the Van der Pauw method to provide a mean resistance of the sample while the linear array provides resistance in the reading direction. [1] This difference becomes important for anisotropic materials, which can be correctly measured by the various modifications of the Van der Pauw method.