{"title":"Research work in the Microscope-based Nanoscale Physics Lab","authors":"Sang-Gyeong An","doi":"10.21820/23987073.2022.3.18","DOIUrl":null,"url":null,"abstract":"Assistant Professor Sangmin An is head of the Microscope-based Nanoscale Physics Laboratory (MNPL), Jeonbuk National University, South Korea. He and his team are using atomic force microscope (AFM)-based technology as the basis of their work to make advances in materials science on\n the atomic and molecular levels. The researchers are combining their AFM-based technology with the scanning tunnelling microscope (STM), Raman spectroscopy systems and scanning electron microscope (SEM). Using this variety of techniques is enabling the team to drive progress in their field\n and also assisting with advances in semiconductor technology, including improving surface roughness measurement technology, which directly impacts consumer electronics. An and the team are also focused on nanoscale 3D printing with a view to overcoming limitations associated with the resolution\n of 3D printing. The researchers have fabricated nanopipettes through laser irradiation of perforated glass or quartz using a mechanical puller. The nanopipettes are then attached to a crystal oscillator to enable 3D printing at the nanoscale. The team has developed a process in which physical\n properties of materials can be measured directly using AFM + in situ Raman spectroscopy. By combining AFM-based nanoscale 3D printing technology and optical apparatus, it is possible to measure the physical, electrical, chemical, and optical properties of target materials. An and the team\n are also performing investigations related to Kelvin probe force microscope (KPFM) and friction measurement, as well as improving AFM technology for AFM and quartz tuning fork AFM (QTF-AFM) systems.","PeriodicalId":88895,"journal":{"name":"IMPACT magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IMPACT magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21820/23987073.2022.3.18","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Assistant Professor Sangmin An is head of the Microscope-based Nanoscale Physics Laboratory (MNPL), Jeonbuk National University, South Korea. He and his team are using atomic force microscope (AFM)-based technology as the basis of their work to make advances in materials science on
the atomic and molecular levels. The researchers are combining their AFM-based technology with the scanning tunnelling microscope (STM), Raman spectroscopy systems and scanning electron microscope (SEM). Using this variety of techniques is enabling the team to drive progress in their field
and also assisting with advances in semiconductor technology, including improving surface roughness measurement technology, which directly impacts consumer electronics. An and the team are also focused on nanoscale 3D printing with a view to overcoming limitations associated with the resolution
of 3D printing. The researchers have fabricated nanopipettes through laser irradiation of perforated glass or quartz using a mechanical puller. The nanopipettes are then attached to a crystal oscillator to enable 3D printing at the nanoscale. The team has developed a process in which physical
properties of materials can be measured directly using AFM + in situ Raman spectroscopy. By combining AFM-based nanoscale 3D printing technology and optical apparatus, it is possible to measure the physical, electrical, chemical, and optical properties of target materials. An and the team
are also performing investigations related to Kelvin probe force microscope (KPFM) and friction measurement, as well as improving AFM technology for AFM and quartz tuning fork AFM (QTF-AFM) systems.