The Influence of Solder Void on IGBT Temperature

Jian Hao, Hao Zhang
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引用次数: 1

Abstract

The void in solder layer is the main factor that causes bad heat dissipation of IGBT (Insulated Gate Bipolar Transistor) module. Based on the seven-layer structure of IGBT, this article established a three-dimensional finite element model of IGBT module packaging structure and carried out its thermal analysis, then had a study on the effect of welding layer void on the temperature of IGBT chip. The overall distribution of IGBT module with or without solder hole is compared, meanwhile the article analyzed the effects of void type, size, shape, number and distribution on the temperature distribution of IGBT chips. The results show that the void in the solder layer of the chip has a great influence on the temperature of the chip. The influence of penetrating voids on chip temperature is greater than that of non-penetrating voids, the bigger the single hole is, the higher the temperature of IGBT chip. Voids of the same shape have greater influence on chip temperature at edge and corner positions than those inside the welding layer. The more concentrated the distribution of multiple holes, the higher the chip’s temperature. Therefore, in order to improve the reliability of IGBT, it is necessary to avoid voids in the chip welding layer during the packaging process.
焊料空隙对IGBT温度的影响
焊接层中的空洞是导致IGBT(绝缘栅双极晶体管)模块散热不良的主要因素。本文基于IGBT的七层结构,建立了IGBT模块封装结构的三维有限元模型,并对其进行了热分析,研究了焊接层空隙对IGBT芯片温度的影响。比较了带焊孔和不带焊孔的IGBT模块的整体分布,同时分析了焊孔的类型、尺寸、形状、数量和分布对IGBT芯片温度分布的影响。结果表明,芯片焊料层中的空洞对芯片温度有很大的影响。穿透孔洞对芯片温度的影响大于非穿透孔洞,单孔越大,IGBT芯片温度越高。相同形状的空洞在边缘和角落位置对切屑温度的影响大于焊接层内的空洞。多孔分布越集中,芯片温度越高。因此,为了提高IGBT的可靠性,必须在封装过程中避免芯片焊接层出现空隙。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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