Industrial Quality Prediction System through Data Mining Algorithm

P. Karthigaikumar
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引用次数: 17

Abstract

Based on an assessment of production capabilities, manufacturing sectors' core competency is increased. The importance of product quality in this aspect cannot be overstated. Several academics have introduced Deming's 14 principles, Shewhart cycle, total quality management, and other approaches to decrease the external failure costs and enhance product yield rates. Analysis of industrial data and process monitoring is becoming increasingly important as a part of the Industry 4.0 paradigm. In order to reduce the internal failure cost and inspection overhead, quality control (QC) schemes are utilized by industries. The final product quality has an interactive and cumulative effect of various parameters like operators and equipment in multistage manufacturing processes (MMP). In other cases, the final product is inspected in a single workstation with QC. It's challenging to do a cause analysis in MMP whenever a failure occurs. Several industries are looking for the optimal quality prediction model in order to achieve flawless production. The majority of current approaches solely handles single-stage manufacturing and is inadequate in dealing with MMP quality concerns. To overcome this issue, this paper proposes an industrial quality prediction system with a combination of multiple Program Component Analysis (PCA) and Decision Stump (DS) algorithm for MMP quality prediction. A SECOM (SEmiCOnductor Manufacturing) dataset is used for verification and validation of the proposed model. Based on the findings, it is clear that this model is capable of performing accurate classification and prediction in the field of industrial quality.
基于数据挖掘算法的工业质量预测系统
通过对生产能力的评估,提高制造业的核心竞争力。产品质量在这方面的重要性怎么强调都不为过。一些学者已经引入了Deming的14条原则、Shewhart循环、全面质量管理和其他方法来降低外部失效成本和提高产品成品率。作为工业4.0范例的一部分,工业数据分析和过程监控变得越来越重要。为了降低内部故障成本和检验费用,质量控制(QC)方案被工业应用。在多阶段制造过程中,操作人员和设备等各种参数对最终产品质量的影响是相互作用和累积的。在其他情况下,最终产品由QC在单个工作站进行检验。每当发生故障时,在MMP中进行原因分析是具有挑战性的。一些行业正在寻找最佳的质量预测模型,以实现完美的生产。目前的大多数方法只处理单阶段制造,在处理MMP质量问题方面是不够的。为了克服这一问题,本文提出了一种结合多程序成分分析(PCA)和决策残桩(DS)算法的MMP质量预测系统。SECOM(半导体制造)数据集用于验证和验证所提出的模型。研究结果表明,该模型能够在工业质量领域进行准确的分类和预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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