Large-scale Integrated Circuits Simulation Based on CNT-FET Model

Zhikai Wang, Wenfei Hu, Ziyu Gu, Wenyuan Zhang, S.-D. Yin, Ruitao Wang, Jian Zhang, Yan Wang
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引用次数: 0

Abstract

Carbon nanotube field-effect transistor (CNT-FET), as a kind of efficient device, is expected to be the mainstream product of complementary metal–oxide–semi-conductor (CMOS) integrated circuits (ICs). The simulation based on SPICE model plays a significant role before ICs been fabricated. However, most of the previous circuits and simulations are based on only P-type CNT model. In this paper, we build N-type and P-type CNT model by denominator numerator fit (DNFIT) technique, perform successfully large-scale (>1000) CNT CMOS ICs simulation on CADENCE for the first time. The simulation results show that large scale CNT CMOS ICs can achieve correct logic performance.
基于碳纳米管-场效应管模型的大规模集成电路仿真
碳纳米管场效应晶体管(CNT-FET)作为一种高效器件,有望成为互补金属氧化物半导体(CMOS)集成电路的主流产品。在集成电路制造前,基于SPICE模型的仿真具有重要的意义。然而,以往大多数电路和仿真都是基于p型碳纳米管模型。本文采用DNFIT(分母分子拟合)技术建立了n型和p型碳纳米管模型,并首次在CADENCE上成功进行了大规模(bbb1000)碳纳米管CMOS模拟。仿真结果表明,大规模碳纳米管CMOS集成电路可以实现正确的逻辑性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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