R. Muminov, G. Ergashev, A. Saymbetov, Yo. K. Toshmurodov, S. Radzhapov, A. Mansurova, N. Japashov, Ye. A. Svanbayev
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Abstract
This paper describes the use of an additional inspection drift to improve the electro physical dimensions of a large-sized Si (Li) p-i-n structure.
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