A comprehensive study on the metallographic preparation of W-Re samples for high resolution electron-based microscopy

Abstract

Abstract Modern day rotating X-ray anodes utilize a conversion layer comprised of a tungstenrhenium alloy. The thermomechanical loading of this layer during computed tomography operation introduces various signs of fatigue like cracking, roughening, melting, or microstructural changes. Previous work on preparing tungsten samples primarily considered intact thin films or bulk material. This work focuses on the metallographic preparation of the conversion layer surface, which represents the sample edge in polished cross-sectional cuts. The main goals were minimizing preparation artefacts and maximizing obtainable image quality during electron backscatter diffraction. Twelve preparation methods were compared with regard to edge rounding, chipping, and obtainable image quality. Coating the samples with a thin layer of molybdenum and adding a tungsten sheet for edge stabilization led to vastly improved results. Chemical-mechanical polishing of such a sample gave the most balanced set of considered benchmarks.