High efficiency test system for envelope tracking Power amplifier

Abstract

Design houses are facing business challenges as improving chip performance and integrating latest technologies now. Particularly in PA design area, envelop tracking (ET) and digital distortion (DPD) are main approaches used in improving the performance of PA. The system is discussed in this paper, which is not only including the regular PA test, but also the additional details for ET, such as the synchronization between Radio Frequency (RF) signal and envelope reference signal, and the extraction of shaping table. This paper discusses a method to improve the performance of Power Modulator, which is used to amplify the reference signal as the power amplifier's DC signal. Normally, ATE is used in production line test, but in lab test, traditional test instruments are used. So this approach consumes a lot of time from engineers in data correlation. This paper promotes a high efficiency test system for ETPA, which is based on an open, modular-based platform, compatible for both lab test and production line test.