Complex electrical thermal and radiation aging of dielectric films

Abstract

The effects of electrical, thermal and radiation stresses, singularly or simultaneously, on dielectric films are reviewed. The types of accelerated aging under these stresses and the statistical methods used to evaluate the experimental data for life, including the two-parameter Weibull and the log-normal distributions, are described briefly. The experimental life models currently used for aging are discussed. Recent data on the complex electrical/thermal/radiation aging of dielectric films are described. >