{"title":"LETTER TO THE EDITOR: On the limit to the resolution of photoreflectance techniques for sensing analyte concentration at surfaces","authors":"A. García-Valenzuela, J. Saniger","doi":"10.1088/0963-9659/7/6/003","DOIUrl":null,"url":null,"abstract":"We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.","PeriodicalId":20787,"journal":{"name":"Pure and Applied Optics: Journal of The European Optical Society Part A","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pure and Applied Optics: Journal of The European Optical Society Part A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0963-9659/7/6/003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.