Discussion and failure analysis of PCB warpage

Ying Yang
{"title":"Discussion and failure analysis of PCB warpage","authors":"Ying Yang","doi":"10.1109/ICEPT47577.2019.245186","DOIUrl":null,"url":null,"abstract":"In current trend of miniaturization and integration of electronic devices, surface mount technology process puts higher demands on the demands on the flatness of printed circuit boards. It is a very important topic to minimize the warpage of PCB by optimizing process technology. This article discusses the main causes of PCB warpage and presents a failure analysis case for PCB warpage.","PeriodicalId":6676,"journal":{"name":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","volume":"16 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT47577.2019.245186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

In current trend of miniaturization and integration of electronic devices, surface mount technology process puts higher demands on the demands on the flatness of printed circuit boards. It is a very important topic to minimize the warpage of PCB by optimizing process technology. This article discusses the main causes of PCB warpage and presents a failure analysis case for PCB warpage.
PCB翘曲的讨论与失效分析
在当前电子器件小型化、集成化的趋势下,表面贴装工艺对印刷电路板的平面度提出了更高的要求。通过优化工艺工艺,使PCB板翘曲量最小化是一个非常重要的课题。本文讨论了PCB板翘曲的主要原因,并给出了一个PCB板翘曲的失效分析案例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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