Yuan Yuan, S. Srinivasan, Yiwei Peng, D. Liang, Zhihong Huang, W. Sorin, S. Cheung, Marco Fiorentino, R. Beausoleil
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Abstract
We measure and analyze the bit error rates and eye diagrams of the optical stressed Si-Ge avalanche photodiode at 32 Gb/s NRZ operation. The results illustrate the requirements of the optical signal-to-noise ratio for high-density optical links.
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