Rietveld Refinement: A Technique More than Just Identification

Samal Sk
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Abstract

Powder diffraction analysis and the data profile fitting represent the phase identification of a crystalline material which gives information about its unit cell dimensions. In a polycrystalline sample it is inevitable that certain information is lost as a result of the random orientation of the crystallites. So whole Pattern fitting Structure Refinement is now widely accepted to be an exceptionally valuable method for structural analysis of nearly all classes of crystalline materials not available as single crystals. Least squares approach which means manually refining a model to match experimental data can be said as Rietveld analysis which is an extended refinement analysis of a given diffraction data.
Rietveld细化:一种不仅仅是识别的技术
粉末衍射分析和数据剖面拟合代表了晶体材料的相识别,它提供了有关其单位胞尺寸的信息。在多晶样品中,由于晶体的随机取向,不可避免地会丢失某些信息。因此,整体模式拟合结构精化现在被广泛接受为一种非常有价值的方法,用于几乎所有类型的非单晶晶体材料的结构分析。最小二乘方法是指手动地改进模型以匹配实验数据,可以称之为Rietveld分析,它是对给定衍射数据的扩展改进分析。
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