Development of a 20MeV proton particle-induced X-ray emission analysis method in a helium atmosphere

K. Ishii, A. Terakawa, K. Hitomi, M. Nogami
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引用次数: 0

Abstract

We developed a 20[Formula: see text]MeV particle-induced X-ray emission (PIXE) analysis method using a medical cyclotron, which is conventionally used for positron emission tomography analysis performed in vacuo, during which the target sample is damaged. For non-destructive analysis and ease of switching between target samples, we developed a technique allowing 20[Formula: see text]MeV proton PIXE analysis to be performed at the atmospheric pressure. We filled the PIXE analysis chamber with helium and checked that the continuous background of the Compton tails of nuclear reaction [Formula: see text]-rays increased only minimally, and that the quasi-free electron bremsstrahlung (QFEB) did not increase at all, in the X-ray energy spectrum.
氦大气中20MeV质子粒子诱导x射线发射分析方法的建立
我们利用医用回旋加速器开发了一种20 MeV粒子诱导x射线发射(PIXE)分析方法,该方法通常用于在真空中进行的正电子发射断层扫描分析,在此过程中目标样品被破坏。为了非破坏性分析和易于在目标样品之间切换,我们开发了一种技术,允许在大气压下进行20[公式:见文本]MeV质子PIXE分析。我们用氦填充了PIXE分析室,并检查了核反应康普顿尾射线的连续背景仅轻微增加,并且在x射线能谱中准自由电子轫致辐射(QFEB)根本没有增加。
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