Measurement of total electron emission yield of insulators based on self-terminating charge neutralization.

Yahui Cai, Dan Wang, Kangcheng Qi, Yong-ning He
{"title":"Measurement of total electron emission yield of insulators based on self-terminating charge neutralization.","authors":"Yahui Cai, Dan Wang, Kangcheng Qi, Yong-ning He","doi":"10.1063/5.0080414","DOIUrl":null,"url":null,"abstract":"For insulators, the accumulated charge on the surface after electron bombardment will interfere with the total electron emission yield (TEEY) measurement. This work develops a novel method to automatically measure the TEEY of insulators based on self-terminating charge neutralization using two neutralization electron guns. We perform theoretical analysis and experimental design for the neutralization of positive and negative charges. Positive charges are neutralized by an electron gun whose cathode is equipotential to the sample. Negative charges are neutralized by another electron gun whose cathode is adjusted to a negative potential with respect to the grounded sample, which is set between EP1/e and EP2/e. We test the control and stability performance of the TEEY measurement system based on the timing design of the electron gun switching and believe that it meets the TEEY measurement requirements. The TEEY measurements of glass, Si, and SiO2 are in good agreement with the data reported in the references, which validates the accuracy of our method in this work. We anticipate that our method provides an essential reference for the rapid TEEY measurements of insulators.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"1 1","pages":"055103"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Optical Society of America and Review of Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/5.0080414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

For insulators, the accumulated charge on the surface after electron bombardment will interfere with the total electron emission yield (TEEY) measurement. This work develops a novel method to automatically measure the TEEY of insulators based on self-terminating charge neutralization using two neutralization electron guns. We perform theoretical analysis and experimental design for the neutralization of positive and negative charges. Positive charges are neutralized by an electron gun whose cathode is equipotential to the sample. Negative charges are neutralized by another electron gun whose cathode is adjusted to a negative potential with respect to the grounded sample, which is set between EP1/e and EP2/e. We test the control and stability performance of the TEEY measurement system based on the timing design of the electron gun switching and believe that it meets the TEEY measurement requirements. The TEEY measurements of glass, Si, and SiO2 are in good agreement with the data reported in the references, which validates the accuracy of our method in this work. We anticipate that our method provides an essential reference for the rapid TEEY measurements of insulators.
基于自终止电荷中和的绝缘子总电子发射产率测量。
对于绝缘体来说,电子轰击后表面的电荷积累会干扰总电子发射产额的测量。本文提出了一种基于自终止电荷中和的双中和电子枪自动测量绝缘子TEEY的新方法。我们对正负电荷的中和进行了理论分析和实验设计。正电荷被阴极与样品具有等电位的电子枪中和。负电荷由另一个电子枪中和,该电子枪的阴极相对于接地样品调整为负电位,该电位设置在EP1/e和EP2/e之间。基于电子枪开关定时设计,对TEEY测量系统的控制性能和稳定性进行了测试,认为满足TEEY测量要求。玻璃,Si和SiO2的TEEY测量结果与参考文献中报道的数据吻合良好,这验证了我们在这项工作中方法的准确性。我们期望我们的方法为绝缘子的快速TEEY测量提供重要的参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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