Myeong-Jae Park, H. Cho, T. Yun, S. Byeon, Young Jun Koo, Sang-Sic Yoon, Dong-Uk Lee, Seokwoo Choi, Ji Hwan Park, Jinhyung Lee, Kyungjun Cho, Junil Moon, B. Yoon, Y. Park, Sangmuk Oh, C. Lee, Tae-Kyun Kim, S. Lee, Hyunwoo Kim, Yucheon Ju, SeungGyeon Lim, S. Baek, Kyo Yun Lee, Sang Hun Lee, Woodward We, Seungchan Kim, Yongseok Choi, Seong-Hak Lee, Seungtaek Yang, Gunho Lee, In-Keun Kim, Y. Jeon, Jaewon Park, J. Yun, Chanhee Park, Sun-Yeol Kim, Sungjin Kim, Dong-Yeol Lee, Su-Hyun Oh, T. Hwang, Junghyun Shin, Yu-Ri Lee, Hyunsik Kim, Jaeseung Lee, Youngdo Hur, Sangkwon Lee, Jieun Jang, J. Chun, Joohwan Cho
{"title":"A 192-Gb 12-High 896-GB/s HBM3 DRAM with a TSV Auto-Calibration Scheme and Machine-Learning-Based Layout Optimization","authors":"Myeong-Jae Park, H. Cho, T. Yun, S. Byeon, Young Jun Koo, Sang-Sic Yoon, Dong-Uk Lee, Seokwoo Choi, Ji Hwan Park, Jinhyung Lee, Kyungjun Cho, Junil Moon, B. Yoon, Y. Park, Sangmuk Oh, C. Lee, Tae-Kyun Kim, S. Lee, Hyunwoo Kim, Yucheon Ju, SeungGyeon Lim, S. Baek, Kyo Yun Lee, Sang Hun Lee, Woodward We, Seungchan Kim, Yongseok Choi, Seong-Hak Lee, Seungtaek Yang, Gunho Lee, In-Keun Kim, Y. Jeon, Jaewon Park, J. Yun, Chanhee Park, Sun-Yeol Kim, Sungjin Kim, Dong-Yeol Lee, Su-Hyun Oh, T. Hwang, Junghyun Shin, Yu-Ri Lee, Hyunsik Kim, Jaeseung Lee, Youngdo Hur, Sangkwon Lee, Jieun Jang, J. Chun, Joohwan Cho","doi":"10.1109/ISSCC42614.2022.9731562","DOIUrl":null,"url":null,"abstract":"Ever since the introduction of high bandwidth memory (HBM DRAM) and its succeeding line-ups, HBM DRAM has been heralded as a prominent solution to tackle the memory wall problem. However, despite continual memory advancements the advent of high-end systems, including supercomputers, hyper-scale data centers and machine learning accelerators, are expediting requirements for higher-performance memory solutions. To accommodate the increasing system-level demands, we introduce HBM3 DRAM, which employs multiple new features and design schemes. Techniques such as an on-die ECC engine, internal NN-DFE I/O signaling, TSV auto-calibration, and layout optimization based on machine-learning algorithms are implemented to efficiently control timing skew margins and SI degradation trade-offs. Furthermore, reduced voltage swings allow for improved memory bandwidth, density, power efficiency and reliability.","PeriodicalId":6830,"journal":{"name":"2022 IEEE International Solid- State Circuits Conference (ISSCC)","volume":"15 1","pages":"444-446"},"PeriodicalIF":0.0000,"publicationDate":"2022-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Solid- State Circuits Conference (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC42614.2022.9731562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
Ever since the introduction of high bandwidth memory (HBM DRAM) and its succeeding line-ups, HBM DRAM has been heralded as a prominent solution to tackle the memory wall problem. However, despite continual memory advancements the advent of high-end systems, including supercomputers, hyper-scale data centers and machine learning accelerators, are expediting requirements for higher-performance memory solutions. To accommodate the increasing system-level demands, we introduce HBM3 DRAM, which employs multiple new features and design schemes. Techniques such as an on-die ECC engine, internal NN-DFE I/O signaling, TSV auto-calibration, and layout optimization based on machine-learning algorithms are implemented to efficiently control timing skew margins and SI degradation trade-offs. Furthermore, reduced voltage swings allow for improved memory bandwidth, density, power efficiency and reliability.