Reliability-Aware Resource Allocation and Binding in High-Level Synthesis

Liang Chen, Mojtaba Ebrahimi, M. Tahoori
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引用次数: 17

Abstract

Soft error is nowadays a major reliability issue for nanoscale VLSI, and addressing it during high-level synthesis is essential to improve the efficiency of error mitigation. Motivated by the observation that for behavioral designs, especially control-flow intensive ones, variables and operations have non-uniform soft error vulnerabilities, we propose a novel reliability-aware allocation and binding technique to explore more effective soft error mitigation during high level synthesis. We first perform a comprehensive vulnerability analysis at the behavioral level by considering error propagation and masking in both control and data flows. Then the optimizations based on integer linear programming, as well as heuristic algorithm, are employed to incorporate the behavioral vulnerabilities into the register and functional unit binding phases to achieve cost-efficient error mitigation. The experimental results reveal that compared with the previous techniques which ignored behavioral vulnerabilities, the proposed approach can achieve up to 85% reliability improvement with the same amount of area budget in the RTL design.
高级综合中可靠感知的资源分配与绑定
软误差是目前纳米级超大规模集成电路的主要可靠性问题,在高阶合成过程中解决软误差对于提高误差缓解效率至关重要。针对行为设计,特别是控制流密集的行为设计,变量和操作存在不均匀的软错误漏洞,提出了一种新的可靠性感知分配和绑定技术,以探索更有效的高级综合软错误缓解。首先,通过考虑控制流和数据流中的错误传播和屏蔽,我们在行为层面进行了全面的漏洞分析。然后,采用基于整数线性规划的优化和启发式算法,将行为漏洞整合到寄存器和功能单元绑定阶段,以达到经济有效的错误缓解。实验结果表明,与以往忽略行为漏洞的方法相比,在相同面积预算的RTL设计中,该方法可将可靠性提高85%。
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