Defect Saturation with Carriers in GaN/InGaN LEDs: A potential phenomenon to confront the green gap

D. Nag, A. Laha
{"title":"Defect Saturation with Carriers in GaN/InGaN LEDs: A potential phenomenon to confront the green gap","authors":"D. Nag, A. Laha","doi":"10.1109/PN52152.2021.9597968","DOIUrl":null,"url":null,"abstract":"Non-radiative defects play a major detrimental role by escalating SRH recombination in InGaN LEDs, especially with high Indium composition. Saturation of the defects with injected carriers is well known for various materials. However, this phenomenon is not studied widely for LEDs. This paper highlights some of the pioneering experimental and theoretical advancements toward understanding the concept that not all defects in LEDs participate in SRH recombination, instead part of them get saturated with carriers.","PeriodicalId":6789,"journal":{"name":"2021 Photonics North (PN)","volume":"30 1","pages":"1-1"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Photonics North (PN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PN52152.2021.9597968","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Non-radiative defects play a major detrimental role by escalating SRH recombination in InGaN LEDs, especially with high Indium composition. Saturation of the defects with injected carriers is well known for various materials. However, this phenomenon is not studied widely for LEDs. This paper highlights some of the pioneering experimental and theoretical advancements toward understanding the concept that not all defects in LEDs participate in SRH recombination, instead part of them get saturated with carriers.
GaN/InGaN led中载流子的缺陷饱和:面对绿隙的潜在现象
非辐射缺陷在InGaN led中起着主要的有害作用,特别是在高铟成分的情况下。注入载流子的缺陷饱和在各种材料中是众所周知的。然而,对于led来说,这种现象的研究并不广泛。本文重点介绍了一些开创性的实验和理论进展,以理解并非led中的所有缺陷都参与SRH重组,而是其中一部分被载流子饱和的概念。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信