{"title":"Welcome message","authors":"G. W. Roberts, R. Aitken","doi":"10.1109/TEST.2013.6651865","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"6 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2013-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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