Reliability-evaluation of digital circuits using probabilistic computation schemes

Abstract

The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit's reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth'93 circuits.