The impact of Sn-Oxide on the solder wetting of immersion tin and how to overcome possible solderability defects to ensure constant solder wetting performance

B. Schafsteller, Bernhard Schachtner, Anja Streek, Kenneth Lee, H. Mertens, G. Ramos
{"title":"The impact of Sn-Oxide on the solder wetting of immersion tin and how to overcome possible solderability defects to ensure constant solder wetting performance","authors":"B. Schafsteller, Bernhard Schachtner, Anja Streek, Kenneth Lee, H. Mertens, G. Ramos","doi":"10.1109/IMPACT56280.2022.9966675","DOIUrl":null,"url":null,"abstract":"Immersion tin is a final finish which is widely used in the printed circuit board (PCB) industry. It provides a cost competitive surface protection with excellent corrosion resistance and has the capability for multiple reflow soldering. The tin is deposited on copper by immersion reaction with a typical layer thickness of 0.8 – 1.2 μm. On top of the tin layer an oxide layer is formed, which can influence the properties of the final finish. During the assembly process, an intermetallic compound (IMC) grows connecting the copper substrate and the tin of the solder alloy. The growth of the IMC is a complex function of temp and time. The IMC formation and well distributed pure tin remnants are key factors to obtain a reliable solder joint. With increased aging or reflow of the immersion tin deposit, the role of the tin oxide layer becomes of particular interest influencing properties of solder and immersion tin in liquidus process at reflow step. Due to the IMC formation, the tin layer is facing increasing internal stress which is potentially released via the oxide covered surface. The quality and thickness of the tin oxide layer impacts the solder wetting performance of the final finish, the risk of whisker formation and in particular the stability and appearance of the layer after reflow aging. In this paper, an introduction on typical failure mechanisms and root causes for solder wetting defects of immersion tin will be given. Such defects can become e.g. visible by solder dewetting in certain areas of the soldered pads or by partially shiny appearance of the tin surface after reflow cycles. The mechanisms introduced in this paper are supported by correlating tests to identify possible root causes for the solder wetting defects. Various methods are presented which allow the determination of the tin oxide layer thickness. Different factors are investigated for their impact on the tin oxide layer formation, and various approaches are studied to modify the thickness of the oxide layer. Based on the test results, the properties of the tin oxide layer could be identified as critical parameters for the immersion tin layer performance. The application of a dedicated post-treatment solution can modify the tin oxide layer and improve the performance of the immersion tin deposit regarding appearance and solderability. This is confirmed by optical inspection, different types of solderability tests and whisker evaluation.","PeriodicalId":13517,"journal":{"name":"Impact","volume":"62 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Impact","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT56280.2022.9966675","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Immersion tin is a final finish which is widely used in the printed circuit board (PCB) industry. It provides a cost competitive surface protection with excellent corrosion resistance and has the capability for multiple reflow soldering. The tin is deposited on copper by immersion reaction with a typical layer thickness of 0.8 – 1.2 μm. On top of the tin layer an oxide layer is formed, which can influence the properties of the final finish. During the assembly process, an intermetallic compound (IMC) grows connecting the copper substrate and the tin of the solder alloy. The growth of the IMC is a complex function of temp and time. The IMC formation and well distributed pure tin remnants are key factors to obtain a reliable solder joint. With increased aging or reflow of the immersion tin deposit, the role of the tin oxide layer becomes of particular interest influencing properties of solder and immersion tin in liquidus process at reflow step. Due to the IMC formation, the tin layer is facing increasing internal stress which is potentially released via the oxide covered surface. The quality and thickness of the tin oxide layer impacts the solder wetting performance of the final finish, the risk of whisker formation and in particular the stability and appearance of the layer after reflow aging. In this paper, an introduction on typical failure mechanisms and root causes for solder wetting defects of immersion tin will be given. Such defects can become e.g. visible by solder dewetting in certain areas of the soldered pads or by partially shiny appearance of the tin surface after reflow cycles. The mechanisms introduced in this paper are supported by correlating tests to identify possible root causes for the solder wetting defects. Various methods are presented which allow the determination of the tin oxide layer thickness. Different factors are investigated for their impact on the tin oxide layer formation, and various approaches are studied to modify the thickness of the oxide layer. Based on the test results, the properties of the tin oxide layer could be identified as critical parameters for the immersion tin layer performance. The application of a dedicated post-treatment solution can modify the tin oxide layer and improve the performance of the immersion tin deposit regarding appearance and solderability. This is confirmed by optical inspection, different types of solderability tests and whisker evaluation.
研究了锡氧化物对浸渍锡焊料润湿的影响,以及如何克服可能存在的可焊性缺陷,以保证浸渍锡的润湿性能
浸锡是一种广泛应用于印刷电路板(PCB)行业的最后处理方法。它提供了具有成本竞争力的表面保护,具有优异的耐腐蚀性,并具有多次回流焊接的能力。采用浸渍法在铜表面沉积锡,锡层厚度为0.8 ~ 1.2 μm。在锡层的顶部形成一氧化层,它可以影响最终涂层的性能。在组装过程中,金属间化合物(IMC)生长连接铜衬底和锡的焊料合金。IMC的生长是温度和时间的复杂函数。IMC的形成和均匀分布的纯锡渣是获得可靠焊点的关键因素。随着浸锡层时效或回流的增加,氧化锡层的作用对回流工序中焊料和浸锡性能的影响变得尤为重要。由于IMC的形成,锡层面临着不断增加的内应力,这些内应力可能通过氧化物覆盖的表面释放出来。氧化锡层的质量和厚度会影响最终成品的焊料润湿性能、晶须形成的风险,尤其是回流时效后氧化锡层的稳定性和外观。本文介绍了浸锡湿焊缺陷的典型失效机理和根本原因。这些缺陷可以通过焊盘某些区域的焊料脱湿或回流循环后锡表面部分有光泽而变得可见。本文所介绍的机理得到了相关试验的支持,以确定焊料润湿缺陷的可能根本原因。提出了测定氧化锡层厚度的各种方法。研究了不同因素对氧化锡层形成的影响,并研究了改变氧化锡层厚度的各种方法。根据试验结果,氧化锡层的性能是影响浸锡层性能的关键参数。应用专用后处理溶液可以修饰氧化锡层,改善浸锡镀层的外观和可焊性。这是通过光学检查、不同类型的可焊性测试和晶须评估来证实的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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