First-principles study on the mechanical and electrical properties of unpassivated Si nanowires in <111> direction

Jian-Bo Zhu, Rui-Feng Han, S. Lei, Chuanxin Wen, Hong Yu, Qing‐An Huang
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Abstract

Through systematic first-principles calculations, We have obtained the Young's modulus and piezoresistance coefficients in unpassivated Si nanowires in <;111> direction. All the models are with different diameters. The results based on density functional theory (DFT) have revealed that with the decrease of the diameter, the length of unit cell decreases, and Young's modulus changes bigger sharply as the diameter is small enough. For the piezoresistive properties, Si74 nanowires are more sensitive than the others under different strain conditions, and the piezoresistance coefficients have reached as much as 41.3×10-11Pa-1. However, the piezoresistance coefficients of Si122 and Si182, especially Si182, have changed little under different strain conditions. All these stem from the different kinds of the surface reconstructions and size effects. What's more, the distribution of the partial charge density has been calculated for the further investigation about the electrical properties of unpassivated Si nanowires.
方向上未钝化硅纳米线力学和电学性能的第一性原理研究
通过系统的第一性原理计算,我们得到了未钝化硅纳米线的杨氏模量和压阻系数。所有模型的直径都不一样。基于密度泛函理论(DFT)的结果表明,随着直径的减小,晶胞的长度减小,杨氏模量随直径的减小而急剧增大。对于压阻性能,Si74纳米线在不同应变条件下比其他纳米线更敏感,压阻系数高达41.3×10-11Pa-1。而Si122和Si182的压阻系数,尤其是Si182在不同应变条件下变化不大。所有这些都源于不同类型的表面重构和尺寸效应。并计算了部分电荷密度的分布,为进一步研究未钝化硅纳米线的电学性能提供了理论依据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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