Linear geological structure, traverse orientation and structure resolution and characterisation using 1D and 2D resistivity images

M. Olorunfemi, A. G. Oni, T. K. Fadare, O. Bamidele
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引用次数: 1

Abstract

ABSTRACT This paper presents results of previous investigations involving 1D and 2D resistivity imaging of linear geological structures with varying traverse orientations relative to the structure azimuth with a view to determining the effect of such variation on the resolution of the structures. It observed that the orientation of 2D traverse relative to a fault azimuth significantly determines the resolution of the structure while the alignment of 1D vertical electrical sounding (VES) relative to the structure azimuth defines the form of the VES curve and leads to inconsistency in resistivity and thickness estimates and overall depth estimates at deep depth. 2D structures were best resolved with 2D resistivity images when the traverses were established normal (in-line) to the structure azimuth. Structures delineated by in-line 2D images are corroborated by in-line VES interpretation models and confirmed by drillers’ logs, whereas the resolution of such structure is impaired on parallel (cross-line) 2D resistivity images/maps with distorted and disjointed image of the investigated fault at deep depth. For two orthogonal VES alignments (in-line and cross-line) to the azimuth of an investigated fault, deviations in layer resistivity values were generally ˂17% while thickness/depth estimates deviated by as much as 30–78%, at deep depth.
线性地质结构,导线方向和结构分辨率和特征使用一维和二维电阻率图像
本文介绍了以往对相对于构造方位角不同导线方向的线性地质构造进行一维和二维电阻率成像的研究结果,以期确定这种变化对构造分辨率的影响。研究发现,二维导线相对于断层方位角的方向在很大程度上决定了构造的分辨率,而一维垂直电测深(VES)相对于构造方位角的走向决定了VES曲线的形态,导致深部电阻率、厚度估算和总深度估算不一致。当导线与结构方位角垂直(直线)建立时,二维电阻率图像对二维结构的分辨效果最好。直列二维图像所圈定的构造可通过直列测深解释模型和钻井人员的测井资料得到证实,然而,在平行(交叉)二维电阻率图像/图上,由于所研究断层的深层图像失真和脱节,这种结构的分辨率受到损害。对于对所研究断层方位角的两个正交的VES对准(直线和交叉),层电阻率值的偏差通常为小于17%,而厚度/深度的估计偏差高达30-78%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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