{"title":"Best paper award winners","authors":"Z. Yu, D. Chen","doi":"10.1109/TEST.2013.6651867","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"222 1","pages":"4"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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