Structural, Optoelectronic, and Photoelectrochemical Investigation of CdSe NC's Prepared by Hot Injection Method

S. Barma, Sachin R. Rondiya, Y. Jadhav, Sagar B. Jathar, Ganesh K. Rahane, Avinash V. Rokade, Russell W. Cross, Mamta P Nasane, Vijaya Jadkar, N. Dzade, S. Jadkar
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引用次数: 11

Abstract

In this study, we report the synthesis and characterization of CdSe nanocrystals (NC's) by facile hot injection (HI) method. The formation of CdSe NC's was confirmed by X-ray diffraction (XRD), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS). The optical properties were analyzed by UV-visible and photoluminescence (PL) spectroscopy shows an excitonic peak at 617 nm in PL spectra corresponds to the band gap of  2 eV favourable for optoelectronic device applications. The Photoelectrochemical (PEC) performance of CdSe thin film prepared by spin coating method demonstrates a rise of photocurrent density (Jsc = 0.081 μAcm) after illumination. The Mott-Schottky (MS) and electrochemical impedance spectroscopy (EIS) measurements were further carried out to understand intrinsic properties namely the type of conductivity, flat band potential, charge carrier density (ND), charge transfer resistance, and recombination lifetime. The n-type conductivity, the charge carrier density of ND = 1.292 x 10 cm, and recombination lifetime of 32.4 μs suggest the ideal behaviour of CdSe NC's for device quality photoelectrodes.
热注射法制备CdSe NC的结构、光电及光电化学研究
在这项研究中,我们报告了用易热注射(HI)方法合成和表征CdSe纳米晶体(NC's)。通过x射线衍射(XRD)、拉曼光谱(Raman spectroscopy)和x射线光电子能谱(XPS)证实了CdSe NC的形成。通过紫外可见光谱学和光致发光(PL)光谱分析发现,在617 nm处有一个激子峰,对应于2 eV的带隙,有利于光电子器件的应用。自旋镀膜法制备的CdSe薄膜的光电化学(PEC)性能表明,光照后光电流密度上升(Jsc = 0.081 μAcm)。进一步进行了Mott-Schottky (MS)和电化学阻抗谱(EIS)测量,以了解其固有特性,即电导率类型、平带电位、电荷载流子密度(ND)、电荷转移电阻和复合寿命。n型电导率,ND载流子密度为1.292 x 10 cm,复合寿命为32.4 μs,表明CdSe NC具有器件级光电极的理想性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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