A large scale characterization of RO-PUF

A. Maiti, Jeff Casarona, Luke McHale, P. Schaumont
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引用次数: 330

Abstract

To validate the effectiveness of a Physical Unclonable Function (PUF), it needs to be characterized over a large population of chips. Though simulation methods can provide approximate results, an on-chip experiment produces more accurate result. In this paper, we characterize a PUF based on ring oscillator (RO) using a significantly large population of 125 FPGAs. We analyze the experimental data using a ring oscillator loop delay model, and quantify the quality factors of a PUF such as uniqueness and reliability. The RO-PUF shows an average inter-die Hamming distance of 47.31%, and an average intra-die Hamming distance of 0.86% at normal operating condition. Additionally, we intend to make this large RO frequency dataset available publicly for the research community.
RO-PUF的大规模表征
为了验证物理不可克隆函数(PUF)的有效性,需要在大量芯片上对其进行表征。虽然仿真方法可以提供近似的结果,但片上实验可以获得更准确的结果。在本文中,我们使用大量的125个fpga来表征基于环形振荡器(RO)的PUF。利用环形振荡器环路延迟模型对实验数据进行了分析,量化了PUF的唯一性和可靠性等质量因素。RO-PUF在正常工作状态下,模间平均汉明距离为47.31%,模内平均汉明距离为0.86%。此外,我们打算将这个大型RO频率数据集公开供研究界使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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