T. Tsuruda, I. Kobayashi, M. Tsukude, T. Yamagata, K. Arimoto
{"title":"High-speed/high-band width design methodologies for on chip DRAM core multimedia system LSIs","authors":"T. Tsuruda, I. Kobayashi, M. Tsukude, T. Yamagata, K. Arimoto","doi":"10.1109/CICC.1996.510556","DOIUrl":null,"url":null,"abstract":"Recently, as multimedia LSIs have developed, the demand for high-speed/high-band width LSIs which integrate the DRAM core and logic elements (CPU etc.) have been strongly required. However, the high-speed/high-band width operation induces the large switching noise. This noise degrades a DRAMs operating margin, and especially the data retention characteristics. In this paper, we analyze the noise transmission model and propose a DRAM and logic compatible design methodology to maintain the reliability of high-speed/high-band width system LSIs. Good experimental results are obtained on the test device.","PeriodicalId":74515,"journal":{"name":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","volume":"15 1","pages":"265-268"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ... Custom Integrated Circuits Conference. Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1996.510556","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Recently, as multimedia LSIs have developed, the demand for high-speed/high-band width LSIs which integrate the DRAM core and logic elements (CPU etc.) have been strongly required. However, the high-speed/high-band width operation induces the large switching noise. This noise degrades a DRAMs operating margin, and especially the data retention characteristics. In this paper, we analyze the noise transmission model and propose a DRAM and logic compatible design methodology to maintain the reliability of high-speed/high-band width system LSIs. Good experimental results are obtained on the test device.