Measuring distribution of carrier trap energy state density at interface of dielectric with step pressure wave method

Abstract

The space charge at the interface of FEP-PMMA (fluorinated ethylene propylene-polymethyl methacrylate) is measured by the step pressure wave method, and the relationship between the space charge and its discharge time at room temperature is studied. Considering the dynamic process of the carrier jumping out of the trap at the interface, it is possible to determine the carrier trap energy state density distribution at the interface. It is concluded that information about carrier traps in dielectric materials can be obtained by this technique.<>