{"title":"Verification of the operation reliability by suitable test procedures for GIL","authors":"M. Finkel, W. Boeck, E. Kynast","doi":"10.1109/ELINSL.2002.995967","DOIUrl":null,"url":null,"abstract":"The breakdown distribution functions are presented for arrangements with quasi-homogeneous field distribution and the maximum reduction of the electrical strength due to the area effect is determined. Furthermore, the influence of critical defects is discussed with respect to the on-site tests and the operation reliability. It is shown that the operation reliability of GIL can be verified with the test procedures approved for GIS.","PeriodicalId":10532,"journal":{"name":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","volume":"64 1","pages":"430-434"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2002.995967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The breakdown distribution functions are presented for arrangements with quasi-homogeneous field distribution and the maximum reduction of the electrical strength due to the area effect is determined. Furthermore, the influence of critical defects is discussed with respect to the on-site tests and the operation reliability. It is shown that the operation reliability of GIL can be verified with the test procedures approved for GIS.