Energy resolution of silicon surface-barrier detectors for oxygen and sulphur ions

Ernest D. Klema, Frank J. Camelio, Tillman K. Saylor
{"title":"Energy resolution of silicon surface-barrier detectors for oxygen and sulphur ions","authors":"Ernest D. Klema,&nbsp;Frank J. Camelio,&nbsp;Tillman K. Saylor","doi":"10.1016/0167-5087(84)91339-5","DOIUrl":null,"url":null,"abstract":"<div><p>A group of 9 silicon surface-barrier detectors, 4 manufactured by ORTEC and 5 fabricated by the first author and his students. has been tested for their energy resolutions with oxygen ions of 36.750 and 50 MeV energy and sulphur ions of 51.086 MeV energy from the University of Pittsburgh Van de Graaff accelerator. Six of the detectors had previously been tested with oxygen ions of 25 and 50 MeV energy at Pittsburgh, and those results are compared with the present ones. It is now possible to conclude that the energy resolution of the best detectors is independent of oxygen ion energy between 36.750 and 50 MeV and is about 100 keV (fwhm). When tested with sulphur ions, 4 of the detectors showed anomalous effects, including peaks and smudges both below and above the main peak. Some of these could be eliminated by varying the reverse bias voltage across the detector, others could not. In particular, the ORTEC detector 40, used in the previous work as the standard detector presently available, did not show a single peak at any bias. It is an excellent detector for oxygen ions, but is not useful for sulphur ions. The energy resolution of the best detectors for 51.086 MeV sulphur ions is under 300 keV (fwhm).</p></div>","PeriodicalId":100972,"journal":{"name":"Nuclear Instruments and Methods in Physics Research","volume":"225 1","pages":"Pages 72-77"},"PeriodicalIF":0.0000,"publicationDate":"1984-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0167-5087(84)91339-5","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments and Methods in Physics Research","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0167508784913395","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

A group of 9 silicon surface-barrier detectors, 4 manufactured by ORTEC and 5 fabricated by the first author and his students. has been tested for their energy resolutions with oxygen ions of 36.750 and 50 MeV energy and sulphur ions of 51.086 MeV energy from the University of Pittsburgh Van de Graaff accelerator. Six of the detectors had previously been tested with oxygen ions of 25 and 50 MeV energy at Pittsburgh, and those results are compared with the present ones. It is now possible to conclude that the energy resolution of the best detectors is independent of oxygen ion energy between 36.750 and 50 MeV and is about 100 keV (fwhm). When tested with sulphur ions, 4 of the detectors showed anomalous effects, including peaks and smudges both below and above the main peak. Some of these could be eliminated by varying the reverse bias voltage across the detector, others could not. In particular, the ORTEC detector 40, used in the previous work as the standard detector presently available, did not show a single peak at any bias. It is an excellent detector for oxygen ions, but is not useful for sulphur ions. The energy resolution of the best detectors for 51.086 MeV sulphur ions is under 300 keV (fwhm).

氧和硫离子硅表面势垒探测器的能量分辨
一组9个硅表面势垒探测器,4个由ORTEC制造,5个由第一作者和他的学生制造。已经用36.750和50 MeV能量的氧离子和51.086 MeV能量的硫离子在匹兹堡大学范德格拉夫加速器上测试了它们的能量分辨率。其中六个探测器先前在匹兹堡用25和50 MeV能量的氧离子进行了测试,这些结果与目前的结果进行了比较。现在可以得出结论,最好的探测器的能量分辨率与氧离子能量无关,在36.750至50 MeV之间,约为100 keV (fwhm)。当用硫离子进行测试时,其中4个探测器显示出异常效应,包括主峰下方和上方的峰值和污迹。其中一些可以通过改变检测器上的反向偏置电压来消除,而另一些则不能。特别是,在以前的工作中使用的ORTEC检测器40作为目前可用的标准检测器,在任何偏差下都没有显示单个峰值。它是一种很好的氧离子检测器,但对硫离子没有用处。对于51.086 MeV硫离子,最佳探测器的能量分辨率在300 keV (fwhm)以下。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信