Ernest D. Klema, Frank J. Camelio, Tillman K. Saylor
{"title":"Energy resolution of silicon surface-barrier detectors for oxygen and sulphur ions","authors":"Ernest D. Klema, Frank J. Camelio, Tillman K. Saylor","doi":"10.1016/0167-5087(84)91339-5","DOIUrl":null,"url":null,"abstract":"<div><p>A group of 9 silicon surface-barrier detectors, 4 manufactured by ORTEC and 5 fabricated by the first author and his students. has been tested for their energy resolutions with oxygen ions of 36.750 and 50 MeV energy and sulphur ions of 51.086 MeV energy from the University of Pittsburgh Van de Graaff accelerator. Six of the detectors had previously been tested with oxygen ions of 25 and 50 MeV energy at Pittsburgh, and those results are compared with the present ones. It is now possible to conclude that the energy resolution of the best detectors is independent of oxygen ion energy between 36.750 and 50 MeV and is about 100 keV (fwhm). When tested with sulphur ions, 4 of the detectors showed anomalous effects, including peaks and smudges both below and above the main peak. Some of these could be eliminated by varying the reverse bias voltage across the detector, others could not. In particular, the ORTEC detector 40, used in the previous work as the standard detector presently available, did not show a single peak at any bias. It is an excellent detector for oxygen ions, but is not useful for sulphur ions. The energy resolution of the best detectors for 51.086 MeV sulphur ions is under 300 keV (fwhm).</p></div>","PeriodicalId":100972,"journal":{"name":"Nuclear Instruments and Methods in Physics Research","volume":"225 1","pages":"Pages 72-77"},"PeriodicalIF":0.0000,"publicationDate":"1984-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0167-5087(84)91339-5","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments and Methods in Physics Research","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0167508784913395","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A group of 9 silicon surface-barrier detectors, 4 manufactured by ORTEC and 5 fabricated by the first author and his students. has been tested for their energy resolutions with oxygen ions of 36.750 and 50 MeV energy and sulphur ions of 51.086 MeV energy from the University of Pittsburgh Van de Graaff accelerator. Six of the detectors had previously been tested with oxygen ions of 25 and 50 MeV energy at Pittsburgh, and those results are compared with the present ones. It is now possible to conclude that the energy resolution of the best detectors is independent of oxygen ion energy between 36.750 and 50 MeV and is about 100 keV (fwhm). When tested with sulphur ions, 4 of the detectors showed anomalous effects, including peaks and smudges both below and above the main peak. Some of these could be eliminated by varying the reverse bias voltage across the detector, others could not. In particular, the ORTEC detector 40, used in the previous work as the standard detector presently available, did not show a single peak at any bias. It is an excellent detector for oxygen ions, but is not useful for sulphur ions. The energy resolution of the best detectors for 51.086 MeV sulphur ions is under 300 keV (fwhm).