An integral path self-calibration scheme for a 20.1–26.7GHz dual-loop PLL in 32nm SOI CMOS

M. Ferriss, J. Plouchart, A. Natarajan, A. Rylyakov, B. Parker, A. Babakhani, Soner Yaldiz, B. Sadhu, A. Valdes-Garcia, J. Tierno, D. Friedman
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引用次数: 7

Abstract

A bandwidth self-calibration scheme is introduced as part of a 20.1GHz to 26.7GHz, low noise PLL in 32nm CMOS SOI. A dual-loop architecture in combination with an integral path measurement and correction scheme desensitizes the loop transfer function to the VCO's small signal gain variations. The spread of gain peaking is reduced by self-calibration from 2.4dB to 1dB, when measured at 70 sites on a 300mm wafer. The PLL has a measured phase noise @10MHz offset of -126.5dBc/Hz at 20.1GHz.
基于32nm SOI CMOS的20.1-26.7GHz双环锁相环积分路径自校准方案
介绍了一种带宽自校准方案,作为32nm CMOS SOI中20.1GHz至26.7GHz低噪声锁相环的一部分。双环结构与积分路径测量和校正方案相结合,使环路传递函数对压控振荡器的小信号增益变化不敏感。当在300mm晶圆上的70个位置测量时,增益峰值的扩散通过自校准从2.4dB减少到1dB。锁相环在20.1GHz时的相位噪声测量值为-126.5dBc/Hz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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