Y. Oya, K. Azuma, Akihiro Togari, Moeko Nakata, Qilai Zhou, Mingzhong Zhao, T. Kuwabara, N. Ohno, M. Yajima, Y. Hatano, T. Toyama
{"title":"Effect of Damage Introduction and He Existence on D Retention in Tungsten by High Flux D Plasma Exposure","authors":"Y. Oya, K. Azuma, Akihiro Togari, Moeko Nakata, Qilai Zhou, Mingzhong Zhao, T. Kuwabara, N. Ohno, M. Yajima, Y. Hatano, T. Toyama","doi":"10.1007/978-3-319-99834-3_12","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20946,"journal":{"name":"Recent Advances in Technology Research and Education","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Advances in Technology Research and Education","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-99834-3_12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}