Integrated solutions and related technologies for gate drivers of GaN transistors

G. Cantone, F. Pulvirenti
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引用次数: 2

Abstract

In recent years there has been the appearance on the market of power transistors made with the new GaN E-HEMT technology (Gallium Nitride Enhancement mode High Electron Mobility Transistor), which allow obtaining low losses in the switching phase and therefore high efficiencies for the applications [1],[2]. The characteristics required by a gate driver for driving this new type of power transistors are not fully satisfied by current gate drivers on the market, for high voltage applications, between 100V and 600V. In this work three new gate driver solutions developed in STMicroelectronics will be exposed, specific for driving high voltage GaN transistors. The three devices will be analyzed both from technological and implementation point of view and will be compared to highlight the advantages and drawback of each one.
氮化镓晶体管栅极驱动器集成解决方案及相关技术
近年来,市场上出现了采用新型氮化镓E-HEMT技术(氮化镓增强模式高电子迁移率晶体管)制成的功率晶体管,该技术允许在开关相位获得低损耗,因此具有较高的应用效率[1],[2]。对于100V到600V的高压应用,栅极驱动器驱动这种新型功率晶体管所需的特性,目前市场上的栅极驱动器并不能完全满足。在这项工作中,三种新的栅极驱动器解决方案将暴露在意法半导体开发,专门用于驱动高压GaN晶体管。这三种设备将从技术和实现的角度进行分析,并将进行比较,以突出每种设备的优点和缺点。
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