Electro-optical switch using Ge2Sb2Te5 phase-change material in a silicon MZI structure

Hanyu Zhang, Linjie Zhou, Liangjun Lu, Z. Guo, Jian Xu, Xuecheng Fu, Jianping Chen, B. Rahman
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引用次数: 1

Abstract

We report a novel silicon MZI switch activated by the phase change of a sub-micrometer-size Ge2Sb2Te5 (GST) thin film. The phase change of GST is triggered by electrical pulses, leading to two “self-holding” switching states. Extinction ratio change of 5-dB is measured from the MZI spectrum.
电光开关采用Ge2Sb2Te5相变材料中的硅MZI结构
我们报道了一种由亚微米尺寸的Ge2Sb2Te5 (GST)薄膜相变激活的新型硅MZI开关。GST的相变是由电脉冲触发的,导致两种“自我保持”的开关状态。在MZI谱上测量到5 db的消光比变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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