Evaluation of Microstructure by Precise Measurement of Resistivity in Pure Ti

M. Ueda, T. Sakamoto, M. Ikeda
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Abstract

Several metallic materials have been developed for many purposes by alloying and controlling microstructure. From the viewpoint of materials recycling, several properties should be controlled by the latter in simple alloys. The pur- pose of this work was to establish a method for evaluating microstructure in metallic materials by a precise measurement of electrical resistivity. Electrical resistivities at 77 K and 300 K were measured by a direct current four-point method in commercially purity titanium plates after tensile deformations. The resistivities basically increased by the deformations. The Matthiessen’s plot shows good linearity. Microstructure might be potentially evaluated by this method.
用电阻率精确测量纯钛微结构的评价
通过合金化和控制微观结构,已经开发出多种用途的金属材料。从材料回收的角度来看,简单合金的一些性能应由后者控制。本工作的目的是建立一种通过精确测量电阻率来评价金属材料微观结构的方法。用直流四点法测定了商用纯钛板拉伸变形后在77 K和300 K时的电阻率。电阻率基本上随变形而增加。马蒂森曲线显示出良好的线性。该方法有可能评价材料的微观结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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