A new method and instrument for measurement of plant leaf area

Abstract

A algorithm with minimum memory consumption for labeling connected components in a binary image is presented in this paper. Based on embedded system technology, the algorithm is used in calculating the area of leaves, the high resolution images for this feature is provided by cheap scanner. Using the algorithm, a corresponding image processing program is developed, and it is ported successfully in embedded Linux & QT platform. With higher precision and lower cost, a new portable measuring instrument is developed for leaf area measurement.