X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines.

IF 13.8 1区计算机科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Journal on Selected Areas in Communications Pub Date : 2022-05-10 DOI:10.1017/S143192762200068X

Nestor J Zaluzec

引用次数: 0

Abstract

Aberration correction in the analytical transmission electron microscope is most closely associated with improvements in high-resolution imaging. In this paper, the combination of that technology with new system designs, which optimize both electron optics and x-ray detection, is shown to provide more than a tenfold increase in performance over the last 25 years.

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X 射线光谱学在畸变校正电子光学光束线时代的应用。

分析透射电子显微镜的像差校正技术与高分辨率成像技术的改进密切相关。在本文中，该技术与优化电子光学和 X 射线检测的新系统设计相结合，证明在过去 25 年中性能提高了十倍以上。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Journal on Selected Areas in Communications 工程技术-电信学

CiteScore

30.00

自引率

4.30%

发文量

234

审稿时长

6 months

期刊介绍： The IEEE Journal on Selected Areas in Communications (JSAC) is a prestigious journal that covers various topics related to Computer Networks and Communications (Q1) as well as Electrical and Electronic Engineering (Q1). Each issue of JSAC is dedicated to a specific technical topic, providing readers with an up-to-date collection of papers in that area. The journal is highly regarded within the research community and serves as a valuable reference. The topics covered by JSAC issues span the entire field of communications and networking, with recent issue themes including Network Coding for Wireless Communication Networks, Wireless and Pervasive Communications for Healthcare, Network Infrastructure Configuration, Broadband Access Networks: Architectures and Protocols, Body Area Networking: Technology and Applications, Underwater Wireless Communication Networks, Game Theory in Communication Systems, and Exploiting Limited Feedback in Tomorrow’s Communication Networks.