Randomness Test for Wireless Physical Layer Key Generation

Abstract

Physical layer Key generation is an attractive and recent alternative to achieve security in wireless networks. However, like other security algorithms, performance of physical layer key generation depends on randomness attained by generated keys. In this paper, different types of random tests like Frequency test, Serial test, Entropy test etc. are described and suitability of NIST statistical test suite for physical layer key generation is discussed. Furthermore, various applications of randomness are also briefly described. Since secrecy of key is crucial for wireless communication, a simulation model is developed for physical layer key generation and randomness of generated key is tested using NIST test suite. A set of arbitrary keys is also evaluated for randomness using NIST test. It is found that key generated using developed model is more random as compared to that of set of arbitrary keys. Therefore, this study suggests physical layer key generation as good candidature for achieving security in wireless networks.