Relativistic calculations of secondary ions produced in plasma desorption mass spectrometry

R. Yoosoofmiya, K. Gamalath
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Abstract

I d Time of Flight (TOF) mass spectrometry, the ratio; mass/charge of ions of the sample under investigation is determined by a relationship between time of flight and spectrometer parameters. Usually this relationship is derived using classical (Newtonian) mechanics. Since high energies are involved in the flight of the particles a relativistic treatment is considered. It is investigated whether the relativistic effects are significant or not, for the motion of secondary ions produced in the Plasma Desorption Mass Spectrometer. Treating the motion of these ions relativistically, a relationship between the Time of Flight (TOF) and mass/charge of the ion was derived. Using advanced mathematical software package Maple 6, the derived relationship was compared with classically obtained results. Then it was found that relativistic effects are not significant and they can be ignored for the linear Plasma Desorption Mass Spectrometer.
等离子体解吸质谱法产生的二次离子的相对论计算
d飞行时间(TOF)质谱法,比值;被测样品离子的质量/电荷由飞行时间和光谱仪参数之间的关系决定。通常这种关系是用经典(牛顿)力学推导出来的。由于高能参与了粒子的飞行,因此考虑了相对论的处理方法。研究了等离子体解吸质谱仪产生的二次离子的运动是否具有显著的相对论性效应。对这些离子的运动进行了相对处理,推导出了飞行时间(TOF)与离子质量/电荷的关系。利用先进的数学软件包Maple 6,将推导出的关系式与经典计算结果进行了比较。结果表明,对于线性等离子体解吸质谱仪,相对论效应并不显著,可以忽略。
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