{"title":"Industry leaders panel - How will testing change in the next 10 years?","authors":"P. Nigh","doi":"10.1109/TEST.2011.6139192","DOIUrl":null,"url":null,"abstract":"Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"57 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2011.6139192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.