Industry leaders panel - How will testing change in the next 10 years?

P. Nigh
{"title":"Industry leaders panel - How will testing change in the next 10 years?","authors":"P. Nigh","doi":"10.1109/TEST.2011.6139192","DOIUrl":null,"url":null,"abstract":"Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"57 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2011.6139192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.
行业领袖座谈——测试在未来10年会发生怎样的变化?
行业测试专家将提供他们对未来10年测试将如何变化的看法。主题将涵盖测试设备、面向测试的设计、EDA软件、铸造测试支持和测试方法的未来。该小组将描述测试领域的基本变化以及这些变化的长期影响。小组成员还将介绍这些趋势如何推动新兴商业机会。小组成员将以一种在正式论文或演讲中从未见过的方式做出挑衅性的预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信