Y. Tanaka, D. Hanazawa, K. Hijikata, H. Miyake, T. Takada
{"title":"Current Integrated Charge Measurement Evaluation of Insulation Layer for Power Module using DC Current Integrated Charge Measurement","authors":"Y. Tanaka, D. Hanazawa, K. Hijikata, H. Miyake, T. Takada","doi":"10.1109/ICD46958.2020.9341898","DOIUrl":null,"url":null,"abstract":"DC current integrated charge measurement (Q(t) method) is applied to evaluate the performance of insulating layer used in power module at high temperature under high DC stress. It is said that a s pace charge accumulation is one of important factors to evaluate the insulating materials, and the Q(t) measurement is an effective method that is available to the actual devices. Therefore, the Q(t) method was attempted to be applied to evaluate the insulating layers in some actual IGB T modules. As the result, it is found that the Q(t) method is effective to evaluate the insulating materials used for actually devices.","PeriodicalId":6795,"journal":{"name":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","volume":"26 1","pages":"459-462"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICD46958.2020.9341898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
DC current integrated charge measurement (Q(t) method) is applied to evaluate the performance of insulating layer used in power module at high temperature under high DC stress. It is said that a s pace charge accumulation is one of important factors to evaluate the insulating materials, and the Q(t) measurement is an effective method that is available to the actual devices. Therefore, the Q(t) method was attempted to be applied to evaluate the insulating layers in some actual IGB T modules. As the result, it is found that the Q(t) method is effective to evaluate the insulating materials used for actually devices.