The use of a flat suppressor in low-energy electron diffraction

Abstract

The authors discuss the advantages of using a flat suppressor in low-energy electron diffraction (LEED). A flat-suppressor system which incorporates a channel electron multiplier plate and a phosphor screen detector is described. The LEED patterns can be analysed using standard lineshape fitting programs. Preliminary results from experiments on the hexagonal incommensurate phase of potassium chemisorbed on Ni(111) are presented.