MTTG: An efficient technique for test data generation

Abstract

Test data generation is a significant part of software and/or hardware testing. It is a complex problem and researchers have proposed various solutions to generate optimum number of test data in an acceptable polynomial time. However, most of the solutions are highly complex (NP-hard), interaction limitation and takes substantial time to generate test data set. Therefore, it is an open challenge to propose the best solution. This paper proposes a novel technique called MTTG (Multi-Tuple based T-way Test Generator) which relies on Kid's Card game strategy. The proposed technique finds optimum matching value by searching through all possible combination of similarity matching, based on data generation principle. Our empirical results demonstrate that the proposed MTTG is very efficient in test data generation based on time and interaction strength/level, compared to other existing strategies.